HTS heading 9031
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof — 28 codes under this heading, with the duty on each.
| Code | Description | General rate | Units |
|---|---|---|---|
| 9031 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof + Ch. 99 | not stated | — |
| 9031.10.00.00 | Machines for balancing mechanical parts + Ch. 99 | Free | No. |
| 9031.20.00.00 | Test benches + Ch. 99 | 1.7% | No. |
| 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) + Ch. 99 | Free | — |
| 9031.41.00.20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices + Ch. 99 | Free (inherited from 9031.41.00) | No. |
| 9031.41.00.40 | For wafers + Ch. 99 | Free (inherited from 9031.41.00) | No. |
| 9031.41.00.60 | Other + Ch. 99 | Free (inherited from 9031.41.00) | No. |
| 9031.49 | Other + Ch. 99 | not stated | — |
| 9031.49.10.00 | Profile projectors + Ch. 99 | Free | No. |
| 9031.49.40.00 | Coordinate-measuring machines + Ch. 99 | Free | No. |
| 9031.49.70.00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices + Ch. 99 | Free | No. |
| 9031.49.90.00 | Other + Ch. 99 | Free | No. |
| 9031.80 | Other instruments, appliances and machines + Ch. 99 | not stated | — |
| 9031.80.40.00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles + Ch. 99 | Free | No. |
| 9031.80.80 | Other + Ch. 99 | Free | — |
| 9031.80.80.60 | For testing electrical characteristics + Ch. 99 | Free (inherited from 9031.80.80) | kg |
| 9031.80.80.70 | Other + Ch. 99 | Free (inherited from 9031.80.80) | kg |
| 9031.80.80.85 | Other + Ch. 99 | Free (inherited from 9031.80.80) | kg |
| 9031.90 | Parts and accessories + Ch. 99 | not stated | — |
| 9031.90.21.00 | Of profile projectors + Ch. 99 | Free | kg |
| 9031.90.45.00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 + Ch. 99 | Free | kg |
| 9031.90.54.00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 + Ch. 99 | Free | kg |
| 9031.90.59.00 | Other + Ch. 99 | Free | kg |
| 9031.90.70.00 | Of articles of subheading 9031.80.40 + Ch. 99 | Free | kg |
| 9031.90.91 | Other + Ch. 99 | Free | — |
| 9031.90.91.30 | Of machines for balancing mechanical parts + Ch. 99 | Free (inherited from 9031.90.91) | kg |
| 9031.90.91.60 | Of test benches + Ch. 99 | Free (inherited from 9031.90.91) | kg |
| 9031.90.91.95 | Other + Ch. 99 | Free (inherited from 9031.90.91) | kg |
9 of these lines state no rate of their own and inherit one from the line above, which is how the schedule is read. Each says which line it came from.
Additional duties may apply
28 lines here reference Chapter 99, where Section 301, Section 232 and other additional duties live. Those are charged on top of the general rate and depend on where the goods were made. What those provisions are.
Source: Harmonized Tariff Schedule of the United States, U.S. International Trade Commission (public domain). Classification and the duties that finally apply to a shipment are a licensed customs broker's call.